Power Management During Scan Based Sequential Circuit Testing
نویسندگان
چکیده
منابع مشابه
Power Management during Scan Based Sequential Circuit Testing
This paper shows that not every scan cell contributes equally to the power consumption during scan based test. The transitions at some scan cells cause more toggles at the internal signal lines of a circuit than the transitions at other scan cells. Hence the transitions at these scan cells have a larger impact on the power consumption during test application. These scan cells are called power s...
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ژورنال
عنوان ژورنال: Advanced Computing: An International Journal
سال: 2011
ISSN: 2229-726X
DOI: 10.5121/acij.2011.2302